ATE Test Development — Any-Frequency Clock Generator

Production-ready test program and multi-socket load board on a custom 16-site ATE platform. Full functional, jitter and thermal qualification from –40°C to +125°C with production throughput at 25°C.

Platform: Custom 16-site ATE

Device: Clock Generator

Qualification: –40°C to +125°C

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Project Summary

We delivered a high-throughput ATE solution for the clock generator using a custom 16-site platform. The test flow covers DC/power validation, functional frequency synthesis checks, differential and single-ended output characterization, jitter and phase-noise profiling, spread-spectrum verification, I²C/NVM programming, and full thermal qualification.

Primary Goals

Full electrical & timing coverage per datasheet
Multi-site production throughput (16 DUTs)
Qualification across –40°C to +125°C

Outcome

High site-to-site repeatability & low variance
Automated NVM programming & profile checks
Production-ready integration at 25°C

Test Development Approach

Power & DC Tests: Core & VDDO currents, power sequencing, initialization timing and power ramp behavior.
Functional & Timing: Any-frequency generation validation, crosspoint mux & profile switching, OE/glitch-free switching, and skew adjustments.
Jitter & Noise: RMS jitter, cycle-to-cycle jitter, additive phase jitter for fan-out, and PCIe compliance checks.
I²C & NVM: In-system programming, profile storage validation, and register integrity across temperatures.
Qualification: Thermal sweep runs, stress cycles, and parametric drift monitoring from –40°C to +125°C.

Load Board & Instrumentation

16-socket modular load board with matched 100 Ω differential routing and configurable terminations. Per-site AWG/capture pairs for accurate phase & jitter measurement, and integrated temperature sensing for traceable qualification.

16-socket modular load board, matched 100 Ω differential routing
Per-site AWG/capture pairs and phase-noise capture paths
On-board I²C routing with isolation switching for safe NVM operations
Per-site temperature sensing and chamber telemetry

Test Plan Snapshot

DC & power validation across VDD/VDDO combinations and temperature.
Frequency generation checks (integer & fractional) up to 333 MHz.
Phase-noise and jitter profiling, including additive jitter for fan-out chains.
Spread-spectrum modulation verification.
I²C/NVM programming and profile persistence checks.

Hardware & Instrumentation

Custom multi-site ATE controller (16 synchronized sites)
High-speed counters, phase-noise analyzers, DMMs and AWGs
Thermal chamber integration and per-site telemetry
Python/C++ automated test framework with database logging

Technology Stack

Custom Multi-site ATE controller (16 synchronized sites)
High-speed counters, phase-noise analyzers, DMMs and AWGs
Python/C++ automated test framework with database logging
Thermal chamber integration and per-site telemetry

Key Metrics

Sites (parallel)

333 MHz

Max output freq

–40 → +125

Qualification °C

Download & Contact

Request the printable case study or schedule a technical walkthrough to adapt this solution for your clock devices.

Need a multi-site ATE solution for your timing devices?

We can adapt our similar clock generator modules, load-board architecture, and thermal qualification flows to your custom clock or buffer ICs—fast integration with your production lines.